Depto. de Semicondut. Instrumentos e Fotônica

Artigos publicados em revistas de circulação internacional especializadas

1.
V.Baranauskas, R.S.Pereira e N.A.Parizotto, ``Observation of baker's yeast strains used in biotransformation by atomic force microscopy'', Applied Biochemistry and Biotechnology, 2(59), 230-236, (1996).
2.
J.W.Swart, M.Favoretto, M.A.A.Pudenzi, J.Pereira de Souza, H.Boudinov e A.J.Petenate, ``Ion Implantation and ElectricalActivation of Si in GaAs for Self-Aligned MESFETs'', Journal of Solid-State Devices and Circuits, 4(1), 17-23, (1996).
3.
M.C.V.Lopes, S.G.dos Santos Fo, C.M.Hasenack e V.Baranauskas, ``Si-Si02 Electronic Interface roughness as a consequence of Si-Sio2 topographic Interface roughness'', Journal of the Electrochemical Society, 143(3), 1021-1025, (1996).
4.
V.J.Trava-airoldi, M.C.Valera, J.R.Freitas e V.Baranauskas, ``Development of chemical vapor deposition diamond burrs using hot filament'', Review of scientific Instruments, 67(5), 1993-1995, (1996).
5.
J.W.Swart e W.A.M.Van Noije, ``The Multi Project Chip Program of FAPESP'', Journal of Solid-State Devices and Circuits, 4(2), 30, (1996).
6.
J.A.Diniz, P.J.Tatsch e M.A.A.Pudenzi, ``Oxynitride films formed by low energy NO+ implantation into silicon'', Applied Physics Letters, 69(15), 2214-2215, (1996).
7.
G.I.Surdutovich, J.Kolenda, J.F.Fragalli, L.Misogutti, R.Z.Vitlina e V.Baranauskas, ``An interference method for the determination of thin-film anisotropy'', Thin Solid Films, 279, 119-123, (1996).


3/2/1998