Depto. de Semicondut. Instrumentos e Fotônica
- 1.
- V.Baranauskas, R.S.Pereira e N.A.Parizotto,
``Observation of baker's yeast strains used in biotransformation by atomic force microscopy'',
Applied Biochemistry and Biotechnology,
2(59), 230-236,
(1996).
- 2.
- J.W.Swart, M.Favoretto, M.A.A.Pudenzi, J.Pereira de Souza, H.Boudinov e A.J.Petenate,
``Ion Implantation and ElectricalActivation of Si in GaAs for Self-Aligned MESFETs'',
Journal of Solid-State Devices and Circuits,
4(1), 17-23,
(1996).
- 3.
- M.C.V.Lopes, S.G.dos Santos Fo, C.M.Hasenack e V.Baranauskas,
``Si-Si02 Electronic Interface roughness as a consequence of Si-Sio2 topographic Interface roughness'',
Journal of the Electrochemical Society,
143(3), 1021-1025,
(1996).
- 4.
- V.J.Trava-airoldi, M.C.Valera, J.R.Freitas e V.Baranauskas,
``Development of chemical vapor deposition diamond burrs using hot filament'',
Review of scientific Instruments,
67(5), 1993-1995,
(1996).
- 5.
- J.W.Swart e W.A.M.Van Noije,
``The Multi Project Chip Program of FAPESP'',
Journal of Solid-State Devices and Circuits,
4(2), 30,
(1996).
- 6.
- J.A.Diniz, P.J.Tatsch e M.A.A.Pudenzi,
``Oxynitride films formed by low energy NO+ implantation into silicon'',
Applied Physics Letters,
69(15), 2214-2215,
(1996).
- 7.
- G.I.Surdutovich, J.Kolenda, J.F.Fragalli, L.Misogutti, R.Z.Vitlina e V.Baranauskas,
``An interference method for the determination of thin-film anisotropy'',
Thin Solid Films,
279, 119-123,
(1996).
3/2/1998