DE CASTRO, A. R. B.; VASCONCELLOS, A. R.; LUZZI, R.; Transient analysis of thermal distortion in a silicon substrate on incidence of a single soft X-ray FEL pulse, 05/2011, 3 Conference on Damage to VUV, EUV, and X-ray Optics III,Vol. 8077, pp.1-10, Czech Republic, República Tcheca, 2011
